Mgr. Daniel Franta, Ph.D.

2004

• Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr ROCA I CABARROCAS Pere

  Article in Periodical

  Thin Solid Films, year: 2004, volume: 455-456, edition: 1

• Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr OHLÍDAL Miloslav

  Article in Periodical

  Surface and Interface Analysis, year: 2004, volume: 36, edition: 8

• Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films

  OHLÍDAL Ivan FRANTA Daniel FRUMAR Miroslav JEDELSKÝ Jaroslav OMASTA Jaroslav

  Article in Periodical

  Journal of Optoelectronics and Advanced Materials, year: 2004, volume: 6, edition: 1

• Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O

  OHLÍDAL Ivan OHLÍDAL Miloslav FRANTA Daniel ČUDEK Vladimír BURŠÍKOVÁ Vilma ŠILER Martin

  Article in Proceedings

  SPIE's 49th Annual Meeting, year: 2004

• Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry

  FRANTA Daniel OHLÍDAL Ivan BURŠÍKOVÁ Vilma ZAJÍČKOVÁ Lenka

  Article in Periodical

  Thin Solid Films, year: 2004, volume: 455-456, edition: 1

• Optical properties of ZnTe films prepared by molecular beam epitaxy

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Periodical

  Thin Solid Films, year: 2004, volume: 468, edition: 1-2

2003

• Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

  OHLÍDAL Ivan KLAPETEK Petr FRANTA Daniel

  Article in Periodical

  Československý časopis pro fyziku, year: 2003, volume: 53, edition: 2

• Atomic force microscopy characterization of ZnTe epitaxial films

  KLAPETEK Petr OHLÍDAL Ivan FRANTA Daniel MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Periodical

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 3

• Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model

  FRANTA Daniel OHLÍDAL Ivan FRUMAR Miloslav JEDELSKÝ Jaroslav

  Article in Periodical

  Applied Surface Science, year: 2003, volume: 212-213, edition: 1

• New Dispersion Model of the Optical Constants of the DLC Films

  FRANTA Daniel ZAJÍČKOVÁ Lenka BURŠÍKOVÁ Vilma OHLÍDAL Ivan

  Article in Periodical

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 5