Go to main content | Go to main menu | Go to search

doc. RNDr. Petr Mikulík, Ph.D.

Associate professor, Department of Condensed Matter Physics

Office: pav. 09/02028
Kotlářská 267/2
611 37 Brno

Show on the map

Phone: +420 549 49 5886
E‑mail:
social and academic networks:
Basic information
CV

Curriculum vitae

Person Identification
  • doc. RNDr. Petr Mikulík, Ph.D., born 1969 in Brno
Department/Faculty/University
  • Department of Condensed Matter Physics
    Faculty of Science, Masaryk University
    Kotlářská 2, CZ-611 37 Brno, Czech Republic
Function, current position
  • researcher and teacher (associate professor)
Education and academic qualifications
  • 2009, habilitation, habilitation work Absorption and Diffraction Imaging by Synchrotron Laminography, Diffractometry and Crystal Optics
  • 1997, PhD thesis "under double leadership" in Solid State Physics: X-Ray Reflectivity from Planar and Structured Multilayers. Masaryk University, Brno, Czech Republic and Université Joseph Fourier, Grenoble, France
  • 1992, DEA (equiv. MSc.) in Interaction of Matter and Radiation. Diploma thesis: La caracterisation du systeme epitaxial tungstene/saphir par la diffusion des rayons X. Université Joseph Fourier, Grenoble, France
  • 1992, RNDr./Mgr. (equiv. MSc.) in Solid State Physics. Diploma thesis: Difrakce na kvaziperiodických supermřížkách (Diffraction on Quasiperiodic Superlattices). Masaryk University, Brno, Czech Republic
Professional experience
  • 1997- : Researcher, Department of Condensed Matter Physics, Masaryk University
Teaching activities
  • Physics for chemists
  • Computer science and IT for physicists
  • Physics laboratory
  • Optometry laboratory
  • Laboratory of X-ray structure analysis
  • Clean room laboratory of silicon device technology
Research activities
  • Application of x-ray scattering methods (diffraction, reflection) for thin films, meso- and nanostructures. Simulations and applications of x-ray diffractive-refractive optical devices. Application of x-ray imaging microdiffraction technique "Rocking Curve Imaging" (RCI) for crystalline samples. Application and extension of "Synchrotron Radiation Computed Laminography" (SRCL) method for non-destructive testing of laterally extended samples and devices. Lithography and clean room technologies for semiconductor device processing. Material and structure characterisation. Calculations, numerical simulations, experiments.
Professional stays abroad
  • 2001-2002: Fraunhofer Institute for Non-destructive Testing (EADQ), Dresden, Germany
  • 1997/1998: Institute of Semiconductors, Johannes Kepler University, Linz, Austria
  • 1992-1997: CNRS, Laboratoire Louis Néel and ESRF, Grenoble, France (Mgr/DEA and PhD studies under double leadership, half-time shared with Masaryk university)
Other academic activities, research projects, grants
  • Experiments at European synchrotron radiation facilities: ESRF (Grenoble), HASYLAB (Hamburg), ANKA (Karlsruhe).
  • Chief of the clean room laborator for silicon device technology.
  • Research and educational projects, grants, ...
Non-university activities
  • Member of the board of the Czech and Slovak Crystallography Association.
  • Head of the Regional Board of Czech and Slovak Crystallographers.
  • Delegate of the Czech Republic in the European Synchrotron User Organisation
Major publications
  • NÁDAŽDY, Peter, Jakub HAGARA, Matej JERGEL, Eva MAJKOVÁ, Petr MIKULÍK, Zdenko ZÁPRAŽNÝ, Dusan KORYTÁR a Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, roč. 52, JUN 2019, s. 498-506. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S1600576719003674. URL info
  • FARAGÓ, Tomáš, Petr MIKULÍK, A. ERSHOV, M. VOGELGESANG, D. HANSCHKE a T. BAUMBACH. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. CHESTER: INT UNION CRYSTALLOGRAPHY, 2017, roč. 24, November, s. 1283-1295. ISSN 1600-5775. Dostupné z: https://dx.doi.org/10.1107/S1600577517012255. URL info
  • PRAJZLER, V., M. NERUDA, P. NEKVINDOVÁ a Petr MIKULÍK. Properties of Multimode Optical Epoxy Polymer Waveguides Deposited on Silicon and TOPAS Substrate. Radioengineering. PRAHA: SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, 2017, roč. 26, č. 1, s. 10-15. ISSN 1210-2512. Dostupné z: https://dx.doi.org/10.13164/re.2017.0010. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, M. JERGEL, P. ŠIFFALOVIČ, E. DOBROČKA, P. VAGOVIČ, C. FERRARI, Petr MIKULÍK, M. DEMYDENKO a M. MIKLOŠKA. Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications. Optical Engineering. 2015, roč. 54, č. 3, s. "035101-1"-"035101-12", 12 s. ISSN 0091-3286. Dostupné z: https://dx.doi.org/10.1117/1.OE.54.3.035101. URL info
  • LI, Z.J., A.N. DANILEWSKY, L. HELFEN, Petr MIKULÍK, D. HAENSCHKE, J. WITTGE, D. ALLEN, P. MCNALLY a T. BAUMBACH. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging. Journal of Synchrotron Radiation. USA: WILEY-BLACKWELL PUBLISHING, 2015, roč. 22, July, s. 1083-1090. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S1600577515009650. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO, Petr MIKULÍK, E. DOBROČKA, C. FERRARI, P. VAGOVIČ a M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. Advances in X-Ray/EUV Optics and Components IX. 9207. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, s. "nestránkováno", 14 s. ISBN 978-1-62841-234-5. Dostupné z: https://dx.doi.org/10.1117/12.2061353. URL info
  • KORYTÁR, D., P. VAGOVIČ, K. VÉGSÖ, P. ŠIFFALOVIČ, E. DOBROČKA, W. JARK, V. ÁČ, Z. ZÁPRAŽNÝ, C. FERRARI, A. CECILIA, E. HAMANN, Petr MIKULÍK, T. BAUMBACH, M. FIEDERLE a M. JERGEL. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, č. 4, s. 945-952. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S0021889813006122. URL URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, Petr MIKULÍK a V. ÁČ. Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, Aug, s. 933-938. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S002188981300558X. URL info
  • KORYTÁR, D., P. VAGOVIČ, C. FERRARI, P. ŠIFFALOVIČ, M. JERGEL, E. DOBROČKA, Z. ZÁPRAŽNÝ, V. ÁČ a Petr MIKULÍK. Process-induced inhomogeneities in higher asymmetry angle X-ray monochromators. In A. Khounsary, S. Goto, and C. Morawe. Advances in X-Ray/EUV Optics and Components VIII. 8848. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2013, s. "88480U-1-88480U-8", 8 s. ISBN 978-0-8194-9698-0. Dostupné z: https://dx.doi.org/10.1117/12.2025142. URL info
  • OBERTA, P., J. HRDÝ a Petr MIKULÍK. A proof-of-principle experiment of a novel harmonics separation optics for synchrotron facilities. Journal of Synchrotron Radiation. Hoboken, USA: WILEY-BLACKWELL PUBLISHING, 2012, roč. 19, č. 6, s. 1012-1014. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049512036618. URL info
  • HRDÝ, J., Petr MIKULÍK a P. OBERTA. Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 299-301. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049510049204. URL info
  • FERRARI, C., F. GERMINI, D. KORYTÁR, Petr MIKULÍK a L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, roč. 44, č. 44, s. 353-358. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S0021889811001439. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER a J. HRDÝ. X-ray collimation by crystals with precise parabolic holes based on diffractive-refractive optics. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 522-526. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049511009083. URL info
  • HELFEN, L., A. MYAGOTIN, Petr MIKULÍK, P. PERNOT, A. VOROPAEV, M. ELYYAN, M. DI MICHIEL, J. BARUCHEL a T. BAUMBACH. On the implementation of computed laminography using synchrotron radiation. Review of Scientific Instruments. Melville (USA): American Institute of Physics, 2011, roč. 82, č. 1, s. "nestrankovano", 8 s. ISSN 0034-6748. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK, A. CECILIA, C. FERRARI, Y. YANG, D. HANSCHKE, E. HAMANN, D. PELLICCIA, T.A. LAFFORD, M. FIEDERLE a T. BAUMBACH. In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 753-760. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S090904951102989X. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER, J. HRDÝ a L. PEVERINI. Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces. Journal of Synchrotron Radiation. 2010, roč. 17, č. 1, s. 36-40. ISSN 0909-0495. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, P. VAGOVIČ, E. DOBROČKA, V. ÁČ, P. KONOPKA, A. ERKO a N. ABROSIMOV. Linearly graded GeSi beam-expanding/compressing X-ray monochromator. Journal of Applied Crystallography. 2010, roč. 2010, č. 43, s. 176-178. ISSN 0021-8898. URL info
  • HOVORKA, Miloš, Filip MIKA, Petr MIKULÍK a Luděk FRANK. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, roč. 51, č. 2, s. 237-242. ISSN 1345-9678. URL info
  • HUBER, I., Petr MIKULÍK a T. BAUMBACH. Correctness of a particular solution of inverse problem in rocking curve imaging. physica status solidi (a). Wiley, 2009, roč. 208, č. 8, s. 1860-1864. ISSN 1862-6300. URL info
  • BAUMBACH, Tilo a Petr MIKULÍK. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin: Springer, 2009, s. 235-288. Lecture Notes in Physics: 770. ISBN 978-3-540-88587-0. URL info
  • HOLÝ, Václav, T. BAUMBACH, D. LÜBBERT, L. HELFEN, M. ELLYAN, Petr MIKULÍK, S. KELLER, S.P. DENBAARS a J. SPECK. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B. USA: The American Physical Society, 2008, roč. 77, č. 1, s. 094102-94110. ISSN 1098-0121. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, F. GERMINI, P. VAGOVIČ a T. BAUMBACH. High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors. In Modern Developments in X-Ray and Neutron Optics. Berlin: Springer, 2008, s. 501-512. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • ÁČ, V., P. PERICHTA, D. KORYTÁR a Petr MIKULÍK. Thermal effects under synchrotron radiation power absorption. In Modern Developments in X-Ray and Neutron Optics. Berlín: Springer, 2008, s. 513-524. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • LÜBBERT, D., T. BAUMBACH, Václav HOLÝ, Petr MIKULÍK, L. HELFEN, P. PERNOT, M. ELLYAN, S. KELLER, T.M. KATONA, S.P. DENBAARS a J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, 2008, roč. 82, č. 5, s. 56002-56006. ISSN 0295-5075. URL info
  • KULHA, P., A. BOURA, M. HUSÁK, Petr MIKULÍK, Milan KUČERA a Stanislav VALENDA. Design and Fabrication of High-Temperature SOI Strain-Gauges. In 7th International Conference on Advanced Semiconductor Devices and Microsystems. New York: IEEE, 2008, s. 175-178. ISBN 978-1-4244-2325-5. info
  • HELFEN, L., A. MYAGOTIN, A. RACK, P. PERNOT, Petr MIKULÍK, M. DIMICHIEL a T. BAUMBACH. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices. Physica stat.sol.(a). 2007, roč. 204, č. 8, s. 2760-2765. ISSN 0031-8965. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK a C. FERRARI. On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instruments and Methods in Physics Research Section B. ELSEVIER (NORTH-HOLLAND), 2007, roč. 265, č. 2, s. 599-604. ISSN 0168-583X. URL info
  • HELFEN, L., T. BAUMBACH, D. KIEL, P. PERNOT, Petr MIKULÍK, P. CLOETENS a J. BARUCHEL. Three-dimensional Imaging by Synchrotron Radiation Computed Laminography. ESRF Highlights 2005. Francie: ESRF, 2006, roč. 2006, č. 1, s. 107-108. info
  • LÜBBERT, D., Petr MIKULÍK, P. PERNOT, L. HELFEN, M.D. CRAVEN, S. KELLER, S. DENBAARS a T. BAUMBACH. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a). 2006, roč. 203, č. 7, s. 1733-1738. ISSN 0031-8965. URL info
  • HELFEN, L., A. MYAGOTIN, P. PERNOT, M. DIMICHIEL, Petr MIKULÍK, A. BERTHOLD a T. BAUMBACH. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging. Nuclear Instruments & Methods in Physics Research A. 2006, roč. 563, č. 1, s. 163-166. ISSN 0168-9002. URL info
  • MIKULÍK, Petr, D. LÜBBERT, P. PERNOT, L. HELFEN a T. BAUMBACH. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2006, roč. 253, č. 1, s. 188-193. ISSN 0169-4332. URL info
  • LÜBBERT, D., C. FERRARI, Petr MIKULÍK, P. PERNOT, L. HELFEN, N. VERDI, D. KORYTÁR a T. BAUMBACH. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2005, roč. 38, č. 1, s. 91-96. ISSN 0021-8898. URL info
  • LÜBBERT, D., T. BAUMBACH, Petr MIKULÍK, P. PERNOT, L. HELFEN, R. KÖHLER, T.M. KATONA, S. KELLER, T.M. KATONA a S.P. DENBAARS. Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2005, roč. 38, 10A, s. A50-A5, 5 s. ISSN 0022-3727. URL info
  • HELFEN, L., T. BAUMBACH, Petr MIKULÍK, D. KIEL, P. PERNOT, P. CLOETENS a J. BARUCHEL. High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography. Applied Physics Letters. USA: American Institute of Physics, 2005, roč. 86, č. 1, s. 071915-1, 3 s. ISSN 0003-6951. URL info
  • CAHA, Ondřej, Petr MIKULÍK, Jiří NOVÁK, Václav HOLÝ, Simon C. MOSS a Andrew NORMAN. Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction. Physical Review B. USA: American Physical Society, 2005, roč. 72, č. 3, s. 035313-35322. ISSN 1098-0121. info
  • HELFEN, L., F. DEHN, Petr MIKULÍK a T. BAUMBACH. Three-dimensional imaging of cement microstructure evolution during hydration Three-dimensional imaging of cement microstructure evolution during hydration. Advances in Cement Research. London, 2005, roč. 17, č. 3, s. 103-111. ISSN 0951-7197. URL info
  • BAUMBACH, T., L. HELFEN, Petr MIKULÍK a F. DEHN. Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno: Sdružení pro sanace betonových konstrukcí, 2004, s. 71-80. ISSN 1211-3700. URL info
  • MIKULÍK, Petr, D. LÜBBERT, D. KORYTÁR, P. PERNOT a T. BAUMBACH. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A74-A78, 5 s. ISSN 0022-3727. URL info
  • KORYTÁR, D., Petr MIKULÍK, C. FERRARI, J. HRDÝ, T. BAUMBACH, A. FREUND a Alan KUBĚNA. Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A65-A68, 4 s. ISSN 0022-3727. URL info
  • MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK a I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A188, 5 s. ISSN 0022-3727. URL info
  • JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, Š. LUBY, R. SENDERÁK, E. PINČÍK, M. BRUNEL, I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A220, 4 s. ISSN 0022-3727. URL info
  • MIKULÍK, Petr a T. BAUMBACH. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B. USA: The American Phys. Society, 1999, roč. 59, č. 11, s. 7632-7643. ISSN 0163-1829. URL info
  • STANGL, J., Václav HOLÝ, Petr MIKULÍK, G. BAUER, I. KEGEL, T.H. METZGER, O.G. SCHMIDT, C. LANGE a K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, roč. 74, -, s. 3785-3787. ISSN 0003-6951. info
  • LITZMAN, Otto a Petr MIKULÍK. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter. IOP Publishing Ltd, 1999, roč. 11, č. 30, s. 5767-5779. ISSN 0953-8984. info
  • MIKULÍK, Petr. X-ray reflectivity from planar and structured multilayers : Réflectivité des rayons X par des milticouches planaires et structurées (Souběž.) : Rentgenová reflektivita rovinných a strukturovaných multivrstev (Souběž.). 1997, 151 s. info

2024/11/08

Supervision
Qualifications
Publications
Projects
Teaching

You are running an old browser version. We recommend updating your browser to its latest version.