Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
1996
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High Resolution X-Ray Reciprocal Space Mapping
Acta Physica Polonica A, year: 1996, volume: 1996, edition: 89
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Influence of Oxygen Concentration on Optical Properties of Semi-insulating Polycrystalline Silicon Films
Appl. Phys. A, year: 1996, volume: 1996, edition: A63
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Infrared Electrodynamics From Ellipsometric Measurements
Ferroelectrics, year: 1996, volume: 1996, edition: 176
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Interface roughness correlation in tungsten/silicon multilayers
J. Mag. Materials, year: 1996, volume: 1996, edition: 156
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Investigation of Inversion-Asymmetry Effects on the Band Structure of Sn(1)Ge(n) Superlattices
Solid-State Electronics, year: 1996, volume: 40(1996), edition: 1-8
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Local Surface Deformations Induced by Interfacial Misfit Dislocations in Lattice-mismatched heteroepitaxy of EuTe on PbTe(111)
Surface Science, year: 1996, volume: 365(1996), edition: -
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Many crystal x-ray diffractometry on superlattices
Heterostructure Epitaxy and Devices. NATO ASI Series 3. Kluwer Acad. Publl. Dordrecht (D4), year: 1996, volume: 1996, edition: 11
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Optical Anisotropy of SrLaAlO(4) and SrLaAl(0.75)Ga(0.25) O(4) Single Crystals
Phys. Stat. Sol. (b), year: 1996, volume: 1996, edition: 195
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Optical Response of C60 thin Films and Solutions
Physical Review B, year: 1996, volume: 1996, edition: 54
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Quantitative analysis of elastic strains in GaAs/AlAs quantum dots
Physica B, year: 1996, volume: 1996, edition: 227