Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
2002
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Lateral composition modulation in (InAs)(n)/(AlAs)(m) short-period superlattices investigated by high-resolution x-ray scattering
Physical Review B, year: 2002, volume: 66, edition: 8
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Nitrogen in Czochralski-grown silicon
SILICON 2002, Rožnov pod Radhostěm, TECON Scientific, editor K. Vojtěchovský, year: 2002
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Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Physica E, year: 2002, volume: 13, edition: 4
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Polarization anisotropy of photoluminescence from multilayer InAs/GaAs quantum dots
Physica E, year: 2002, volume: 13, edition: 2
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Self-organized semiconductor nanostructures: shape, strain and composition
Materials Science and Engineering, year: 2002, volume: C19, edition: 3
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Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
Phys. Rev. B, year: 2002, volume: 2002, edition: 66
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Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
Physical Review B, year: 2002, volume: B65, edition: 11
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Structural investigation of semiconductor nanostructures by x-ray techniques
Nuclear Instruments & Methods in Physics Research A, year: 2002, volume: 200, edition: 1
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Temperature Dependence of the Optical Spectra of SiGe Alloys
Silicon-Germanium Carbon Alloys, year: 2002, number of pages: 48 s.
2001
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Anomalies in the infrared spectra of underdoped Bi2Sr2CaCu2Oz as evidence for the intrabilayer Josephson effect
Physical Review B, year: 2001, volume: 63(2001), edition: -