Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
2003
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Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique
Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics, year: 2003, volume: 5195, edition: 1
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Dynamical diffraction in layered systems - a quest for the final formula
J. Phys. D: Appl. Phys., year: 2003, volume: 36, edition: 10
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Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction
Applied Physics Letters, year: 2003, volume: 82, edition: 11
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Friction and wear properties of C-N/MeNx nanolayer composites
Thin Solid Films, year: 2003, volume: 94, edition: 12
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Influence of capping on strain, composition and shape of SiGe islands
Material Sci. and Engn., year: 2003, volume: 101, edition: 10
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On the driving forces for the vertical alignment in nitride quantum dot multilayers
Europhysics letters, year: 2003, volume: 63, edition: 5
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Raman-Active c-Axis Plasma Modes in Multilayer High-T_{c} Cuprate Superconductors
Physical Review Letters, year: 2003, volume: 90, edition: February
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Strain field in quantum dots
WDS'03 Proceedings of Contributed Papers, year: 2003
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Structural study of self-assembled Co nanoparticles
Journal of Applied Physics, year: 2003, volume: 94, edition: 8
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Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
J. Phys. D: Appl. Phys., year: 2003, volume: 36, edition: 1