Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
2000
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Strain-induced self-organized growth of nanostructures: From step bunching to ordering in quantum dot superlattices
J. Vac. Sci. Technol. B, year: 2000, volume: 2000, edition: 18
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Structure of Ag/Co multilayers on excimer laser irradiation
Thin Solid Films, year: 2000, volume: 2000, edition: 373
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Temperature stability of C-N/NbN nanocomposite multilayers
Diamond and Related Materials, year: 2000, volume: 2000, edition: 9
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Tuning of Vertical and Lateral Correlations in Self-Organized Quantum Dot Superlattices
Physical Review Letters, year: 2000, volume: 2000(84), edition: 20
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ZnSe/CdTe/ZnSe heterostructures
J. Vac. Sci. Technol. B, year: 2000, volume: 2000(18), edition: 4
1999
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Anomalies of the infrared-active phonons in underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect
Solid state communications, year: 1999, volume: (112)1999, edition: -
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Diffuse x-ray reflection from multilayers with rough interfaces
Journal of Materials Science: Materials in Electronics, year: 1999, volume: (10)1999, edition: -
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Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers
Semicond. Sci. Technol., year: 1999, volume: 32(1999), edition: -
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Does the peak in the magnetic susceptibility determine the in-plane infrared conductivity of YBCO? A theoretical study
Physica C, year: 1999, volume: (312)1999, edition: -
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Far-infrared ellipsometric study of the spectral gap in the c-axis conductivity of Y(1-x)Ca(x)Ba(2)Cu(3)O(7-d) crystals
Physical Review B, year: 1999, volume: 59(1999), edition: 10