Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
1999
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Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy
J. Phys. D: Appl. Phys., year: 1999, volume: 32, edition: 9999
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The far-infrared in-plane conductiivity of YBaCuO studied by ellipsometry
physics status solidi (b), year: 1999, volume: 215, edition: 1
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X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering
Phys. Rev. B, year: 1999, volume: 59, edition: 11
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X-ray reflection from self-organized interfaces in an SiGe/Si multilayer
Semicond. Sci. Technol., year: 1999, volume: 14(1999), edition: -
1998
-
Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers
Physical Review B, year: 1998, volume: (58)1998, edition: 12
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Ellipsometry and transport studies of thin-film metal nitrides
Thin Solid Films, year: 1998, volume: 1998, edition: 332
-
Infrared ellipsometry of LiF
Thin Solid Films, year: 1998, volume: 1998, edition: 313-314
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Oblique roughness replication in strained SiGe/Si multilayers
Physical Review B, year: 1998, volume: (57)1998, edition: 19
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Optical functions of silicon at high temperatures
Journal of Applied Physics, year: 1998, volume: 1998, edition: 11
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Self-organized growth of three-dimensional quantum-dot crystals with fcc-like stacking and a tunable lattice constant
Physical Review Letters, year: 1998, volume: 282(1998), edition: 23