Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
1999
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High-resolution x-ray diffraction on self-organized step bunches of Si<sub>1-x</sub>Ge<sub>x</sub> grown on (113)-oriented Si
J. Phys. D: Appl. Phys., year: 1999, volume: 32, edition: 9999
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High-Resolution X-Ray Scattering From Thin Films and Multilayers
Year: 1999, number of pages: 256 s.
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Infrared Spectroscopy of LiF on Ag and Si
Phys.stat.sol.(b), year: 1999, volume: 215(1999), edition: -
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Optical characterisation of a thick MOVPE InSb film on GaAs
Workshop proceedings EW MOVPE VIII, year: 1999
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Optical properties of thin films of poly(methyl-phenylsilylene)
Optical Materials, year: 1999, volume: 1999, edition: 12
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Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering
Applied Physics Letters, year: 1999, volume: 74, edition: -
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Self-assembled Germanium-dot multilayers embedded in Silicon
Cryst. Res. Technol., year: 1999, volume: 34(1999), edition: 2
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Strain Induced Vertical and Lateral Correlations in Quantum Dot Superlattices
Physical Review Letters, year: 1999, volume: 83(1999), edition: 2
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Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction
J. Phys. D: Appl. Phys., year: 1999, volume: 32, edition: 9999
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Structural characterization of a lamellar W/Si multilayer grating
J. Appl. Phys., year: 1999, volume: 85, edition: 2